Bias-stress characterization of solution-processed organic field-effect transistor based on highly ordered liquid crystals

Publication Information

Title

Japanese:
English:	Bias-stress characterization of solution-processed organic field-effect transistor based on highly ordered liquid crystals

Author

Japanese:	國井正文, 飯野裕明, 半那純一.
English:	Masafumi Kunii, Hiroaki Iino, Jun-ichi Hanna.

Language

English

Journal/Book name

Japanese:
English:	Applied Physics Letters

Volume, Number, Page

Vol. 110 No. 24 p. 243301

Published date

June 12, 2017

Publisher

Japanese:
English:	AIP Publishing

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI