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Title
Japanese: 
English:Reliability Evaluation of Au-Cu Microcantilever by Long-Term Vibration Test toward MEMS Components 
Author
Japanese: 新田 京太朗, 橘 航一朗, TangHao-Chun, 陳 君怡, Chang Tso-Fu Mark, 山根 大輔, 小西 敏文, 町田 克之, 伊藤 浩之, 益 一哉, 曽根 正人.  
English: Kyotaro Nitta, Koichiro Tachibana, Hao-Chun Tang, Chun-Yi Chen, Tso-Fu Mark Chang, Daisuke Yamane, Toshifumi Konishi, Katsuyuki Machida, Hiroyuki Ito, Kazuya Masu, Masato Sone.  
Language English 
Journal/Book name
Japanese: 
English:Nano Engineering and Microsystem Technology Conference, Taiwan 
Volume, Number, Page        
Published date June 1, 2018 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English:The 2nd Taiwan-Japan Joint Symposium in Taiwan, by The study group of the Integrated MEMS of JSAP & Nano Engineering and Microsystem Technology Conference, Taiwan 
Conference site
Japanese: 
English:Taipei 

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