Direct Nanoscale Sensing of the Internal Electric Field in Operating Semiconductor Devices Using a Single Electron Spins

Publication Information

Title

Japanese:
English:	Direct Nanoscale Sensing of the Internal Electric Field in Operating Semiconductor Devices Using a Single Electron Spins

Author

Japanese:	岩崎孝之, 成木航, 田原康佐, T. Makino, H. Kato, M. Ogura, D.Takeuchi, S. Yamasaki, 波多野睦子.
English:	T. Iwasaki, W. Naruki, K. Tahara, T. Makino, H. Kato, M. Ogura, D.Takeuchi, S. Yamasaki, M. Hatano.

Language

English

Journal/Book name

Japanese:
English:	ACS Nano

Volume, Number, Page

Vol. 11 pp. 1238-1245

Published date

Jan. 2017

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI