X-ray structural analysis of epitaxially grown Ag film/Si(111)Root3xRoot3-B substrate interface

Publication Information

Title

Japanese:
English:	X-ray structural analysis of epitaxially grown Ag film/Si(111)Root3xRoot3-B substrate interface

Author

Japanese:	吉池雄作, H. Tajiri, 山﨑詩郎, 中辻寛, 平山博之.
English:	Y. Yoshiike, H. Tajiri, S. Yamazaki, K. Nakatsuji, H. Hirayama.

Language

English

Journal/Book name

Japanese:
English:	Jpn. J. Appl. Phys.

Volume, Number, Page

vol. 57 pp. 075701(1)-(8)

Published date

June 20, 2018

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

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English: