Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

Publication Information

Title

Japanese:
English:	Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

Author

Japanese:	中嶋誠二, 坂田修身, 舟窪浩, 清水荘雄, 一ﾉ瀬大地, Kota Takayama, Yasuhiko Imai, 藤澤浩訓, Masaru Shimizu.
English:	Seiji Nakashima, Osami Sakata, Hiroshi Funakubo, Takao Shimizu, Daichi Ichinose, Kota Takayama, Yasuhiko Imai, Hironori Fujisawa, Masaru Shimizu.

Language

English

Journal/Book name

Japanese:
English:	Appl. Phys. Lett.

Volume, Number, Page

vol. 111 pp. 082907-1-5

Published date

Aug. 2017

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: