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Publication Information
Title
Japanese:
微細半導体プロセスにおける宇宙空間シングルイベント耐性強化技術の検討(2)
English:
A Study on Single Event Mitigation Techniques for Nano-Scale Semiconductor Devices
Author
Japanese:
丸明史
,
松田晃史
,
吉本護
.
English:
Akifumi Maru
,
Akifumi Matsuda
,
MAMORU YOSHIMOTO
.
Language
Japanese
Journal/Book name
Japanese:
English:
Volume, Number, Page
Published date
Sept. 5, 2018
Publisher
Japanese:
English:
Conference name
Japanese:
2018年 第79回 応用物理学会秋季学術講演会
English:
The 79th JSAP Autumn Meeting, 2018
Conference site
Japanese:
名古屋
English:
Nagoya
Official URL
https://meeting.jsap.or.jp
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