Accurate TOF Measurement Using M-sequence Code Based on Vernier Effect | Science Tokyo Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	Accurate TOF Measurement Using M-sequence Code Based on Vernier Effect

Author

Japanese:	Kouta Kizaki, 大山真司.
English:	Kouta Kizaki, Shinji Ohyama.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

pp. 107/111

Published date

Sept. 12, 2018

Publisher

Japanese:
English:

Conference name

Japanese:
English:	SICE Annual Conference 2018

Conference site

Japanese:
English:

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