Measurement of Carrier Lifetime in Microcrystalline Silicon for Optical Modulator

Publication Information

Title

Japanese:
English:	Measurement of Carrier Lifetime in Microcrystalline Silicon for Optical Modulator

Author

Japanese:	近藤優一郎, 松本響介, Ryohei Takei, 庄司雄哉, 水本哲弥, Toshihiro Kamei.
English:	Yuichiro Kondo, Kyosuke Matsumoto, Ryohei Takei, Yuya Shoji, Tetsuya Mizumoto, Toshihiro Kamei.

Language

English

Journal/Book name

Japanese:
English:	Technical Digest of 23rd Microoptics Conference

Volume, Number, Page

Published date

Nov. 2018

Publisher

Japanese:
English:

Conference name

Japanese:
English:	23rd Microoptics Conference

Conference site

Japanese:
English:	Taipei

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