Admittance Measurement for a Quantum Point Contact in Multiterminal Quantum Hall Device

Publication Information

Title

Japanese:	Admittance Measurement for a Quantum Point Contact in Multiterminal Quantum Hall Device
English:	Admittance Measurement for a Quantum Point Contact in Multiterminal Quantum Hall Device

Author

Japanese:	Washio, K., Hashisaka, M., Kamata, H., Muraki, K., Fujisawa, T., 藤澤利正.
English:	Washio, K., Hashisaka, M., Kamata, H., Muraki, K., Fujisawa, T., Toshimasa Fujisawa.

Language

English

Journal/Book name

Japanese:	Japanese Journal of Applied Physics
English:	Japanese Journal of Applied Physics

Volume, Number, Page

Vol. 50 No. 4

Published date

2011

Publisher

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English:

Conference name

Japanese:
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Conference site

Japanese:
English:

Official URL

DOI