Elastic and inelastic single electron tunneling in coupled two dot system

Publication Information

Title

Japanese:	Elastic and inelastic single electron tunneling in coupled two dot system
English:	Elastic and inelastic single electron tunneling in coupled two dot system

Author

Japanese:	Tarucha, S., Fujisawa, T., Ono, K., Austing, D. G., Oosterkamp, T. H., van der Wiel, W. G., Kouwenhoven, L. P., 藤澤利正.
English:	Tarucha, S., Fujisawa, T., Ono, K., Austing, D. G., Oosterkamp, T. H., van der Wiel, W. G., Kouwenhoven, L. P., Toshimasa Fujisawa.

Language

English

Journal/Book name

Japanese:	Microelectronic Engineering
English:	Microelectronic Engineering

Volume, Number, Page

Vol. 47 No. 1-4 pp. 101-105

Published date

1999

Publisher

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Conference name

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Conference site

Japanese:
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Official URL

DOI