Preparation and characterization of S-33 samples for S-33(n,alpha)Si-30 cross-section measurements at the n_TOF facility at CERN

Publication Information

Title

Japanese:
English:	Preparation and characterization of S-33 samples for S-33(n,alpha)Si-30 cross-section measurements at the n_TOF facility at CERN

Author

Japanese:	J. Praena, 片渕竜也, n_TOF Collaboration (133 authors).
English:	J. Praena, Tatsuya Katabuchi (65th author), n_TOF Collaboration (133 authors).

Language

English

Journal/Book name

Japanese:
English:	Nuclear Instruments & Methods in Physics Research. Section A

Volume, Number, Page

Vol. 890 pp. 142-147

Published date

May 11, 2018

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI