Experimental Verification of a 3D Scaling Principle for Low Vce(sat) IGBT

Publication Information

Title

Japanese:
English:	Experimental Verification of a 3D Scaling Principle for Low Vce(sat) IGBT

Author

Japanese:	角嶋邦之, 星井拓也, 筒井一生, A. Nakajima, S. Nishizawa, 若林整, 宗田伊理也, K. Sato, T. Matsudai, W. Saito, T. Saraya, K. Itou, M. Fukui, S. Suzuki, M. Kobayashi, T. Takakura, T. Hiramoto, A. Ogura, Y. Numasawa, I. Omura, 大橋弘通, 岩井洋.
English:	K. Kakushima, T. Hoshii, K. Tsutsui, A. Nakajima, S. Nishizawa, H. Wakabayashi, I. Muneta, K. Sato, T. Matsudai, W. Saito, T. Saraya, K. Itou, M. Fukui, S. Suzuki, M. Kobayashi, T. Takakura, T. Hiramoto, A. Ogura, Y. Numasawa, I. Omura, H. Ohashi, H. Iwai.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

p. 268

Published date

Dec. 2016

Publisher

Japanese:
English:

Conference name

Japanese:
English:	62th International Electron Devices Meeting (IEDM2016)

Conference site

Japanese:
English:	San Francisco