Japanese
Home
Search
Horizontal Search
Publication Search
( Advanced Search )
Patent Search
( Advanced Search )
Research Highlight Search
( Advanced Search )
Researcher Search
Search by Organization
Support
FAQ
T2R2 User Registration
Doctoral thesis registration
Support/Contact
About T2R2
What's T2R2?
Operation Guidance
Leaflets
About file disclosure
Related Links
Tokyo Tech
STAR Search
NII IR Program
Home
>
Help
Publication Information
Title
Japanese:
English:
Scanning Probe Microscopy
Author
Japanese:
中嶋健
.
English:
Ken Nakajima
.
Language
English
Journal/Book name
Japanese:
English:
Compendium of Surface and Interface Analysis
Volume, Number, Page
pp. 583-586
Published date
Mar. 2018
Publisher
Japanese:
English:
Springer
Conference name
Japanese:
English:
Conference site
Japanese:
English:
©2007
Tokyo Institute of Technology All rights reserved.