Comparison Between L-2L and Thru-Reflect-Line De-embedding Methods for W-Band CMOS Amplifier Design

Publication Information

Title

Japanese:
English:	Comparison Between L-2L and Thru-Reflect-Line De-embedding Methods for W-Band CMOS Amplifier Design

Author

Japanese:	ABDOIbrahim Imad Ibrahim, Tokgoz KorkutKaan, 藤村拓弥, 岡田健一, 松澤昭.
English:	Ibrahim Imad Abdo, Korkut Kaan Tokgoz, Takuya Fujimura, Kenichi Okada, Akira Matsuzawa.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Aug. 30, 2017

Publisher

Japanese:
English:

Conference name

Japanese:
English:	IEEE International Symposium on Radio-Frequency Integration Technology

Conference site

Japanese:
English:	Seoul