In situ microfabrication and measurements of Bi<sub>2</sub>Se<sub>3</sub> ultrathin films in a multichamber system with a focused ion beam, molecular beam epitaxy, and four-tip scanning tunneling microscope

Publication Information

Title

Japanese:
English:	In situ microfabrication and measurements of Bi₂Se₃ ultrathin films in a multichamber system with a focused ion beam, molecular beam epitaxy, and four-tip scanning tunneling microscope

Author

Japanese:	Fukui, N., Hobara, R., 平原徹, Hasegawa, S..
English:	Fukui, N., Hobara, R., Toru Hirahara, Hasegawa, S..

Language

English

Journal/Book name

Japanese:
English:	e-Journal of Surface Science and Nanotechnology

Volume, Number, Page

Vol. 12 pp. 423-430

Published date

2014

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI