Electronic Defects in Amorphous Oxide Semiconductors

Publication Information

Title

Japanese:
English:	Electronic Defects in Amorphous Oxide Semiconductors

Author

Japanese:	井手啓介, 野村研二, 細野秀雄, 神谷利夫.
English:	Keisuke Ide, Kenji Nomura, Hideo Hosono, Toshio Kamiya.

Language

English

Journal/Book name

Japanese:
English:	A Review; Phys. Status Solidi A

Volume, Number, Page

216 1800372

Published date

2018

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: