Investigation of Active Load Matching Using GaN HEMT as Digital Switch

Publication Information

Title

Japanese:
English:	Investigation of Active Load Matching Using GaN HEMT as Digital Switch

Author

Japanese:	金井七重, 岡田健一, 宮本恭幸.
English:	Nanae Kanai, Kenichi Okada, Yasuyuki Miyamoto.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

July 2018

Publisher

Japanese:
English:

Conference name

Japanese:
English:	Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD)

Conference site

Japanese:	福岡
English:	Fukuoka