Polarisation analysing CMOS image sensor in 65-nm standard CMOS technology

Publication Information

Title

Japanese:
English:	Polarisation analysing CMOS image sensor in 65-nm standard CMOS technology

Author

Japanese:	N. Wakama, D. Okabayashi, 野田俊彦, 笹川清隆, 德田崇, K. Kakiuchi, 太田淳.
English:	N. Wakama, D. Okabayashi, T. Noda, K. Sasagawa, T. Tokuda, K. Kakiuchi, J. Ohta.

Language

English

Journal/Book name

Japanese:
English:	Journal of Engineering

Volume, Number, Page

Published date

Sept. 2013

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: