Trapped charge mapping in crystalline organic transistors by using scanning Kelvin probe force microscopy

Publication Information

Title

Japanese:
English:	Trapped charge mapping in crystalline organic transistors by using scanning Kelvin probe force microscopy

Author

Japanese:	Ando, M., Heike, S., Kawasaki, M., 橋詰富博.
English:	Ando, M., Heike, S., Kawasaki, M., tomihiro hashizume.

Language

English

Journal/Book name

Japanese:
English:	Applied Physics Letters

Volume, Number, Page

Vol. 105 No. 19

Published date

2014

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI