Japanese
Home
Search
Horizontal Search
Publication Search
( Advanced Search )
Patent Search
( Advanced Search )
Research Highlight Search
( Advanced Search )
Researcher Search
Search by Organization
Support
FAQ
T2R2 User Registration
Doctoral thesis registration
Support/Contact
About T2R2
What's T2R2?
Operation Guidance
Leaflets
About file disclosure
Related Links
Tokyo Tech
STAR Search
NII IR Program
Home
>
Help
Publication Information
Title
Japanese:
EUV光源コレクターミラーの保護膜における劣化メカニズムの解明
English:
Elucidation of deterioration mechanism in protective film of collector mirror for EUV light source
Author
Japanese:
本田 能之
,
柳田 達哉
,
白石 裕
,
森田 昌幸
,
安藤 正彦
,
戸室 啓明
,
松田 晃史
,
吉本 護
.
English:
Yoshiyuki Honda
,
Tatsuya Yanagida
,
Yutaka Shiraishi
,
Masayuki Morita
,
Masahiko Andou
,
Hiroaki Tomuro
,
Akifumi Matsuda
,
MAMORU YOSHIMOTO
.
Language
Japanese
Journal/Book name
Japanese:
English:
Volume, Number, Page
Published date
Sept. 4, 2019
Publisher
Japanese:
応用物理学会
English:
The Japan Society of Applied Physics
Conference name
Japanese:
第80回 応用物理学会 秋季学術講演会
English:
The 80th JSAP Autumn Meeting, 2019
Conference site
Japanese:
札幌
English:
Sapporo
Official URL
https://meeting.jsap.or.jp
©2007
Tokyo Institute of Technology All rights reserved.