Nanoscale Imaging of Molecular Recognition Sites by Amplitude-Modulation Atomic Force Microscopy

Publication Information

Title

Japanese:	Nanoscale Imaging of Molecular Recognition Sites by Amplitude-Modulation Atomic Force Microscopy
English:	Nanoscale Imaging of Molecular Recognition Sites by Amplitude-Modulation Atomic Force Microscopy

Author

Japanese:	前川達洋, Mondarte Evan Angelo Quimada, 田原寛之, 丹生隆, 林智広.
English:	Tatsuhiro Maekawa, Evan Angelo Quimada Mondarte, Hiroyuki Tahara, Takashi Nyu, Tomohiro Hayashi.

Language

English

Journal/Book name

Japanese:	NCTU-Tokyo TECH Symposium
English:	NCTU-Tokyo TECH Symposium

Volume, Number, Page

Published date

Sept. 2, 2019

Publisher

Japanese:
English:

Conference name

Japanese:
English:	NCTU-Tokyo TECH Symposium

Conference site

Japanese:	東京
English:	Tokyo