Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately

Publication Information

Title

Japanese:
English:	Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately

Author

Japanese:	星井拓也, Kazuyoshi Furukawa, 角嶋邦之, 渡辺正裕, Naoyuki Shigyo, Takuya Saraya, Toshihiko Takakura, Kazuo Itou, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi, 宗田伊理也, 若林整, Sinichi Nishizawa, 筒井一生, Toshiro Hiramoto, 大橋弘通, 岩井洋.
English:	Takuya Hoshii, Kazuyoshi Furukawa, Kuniyuki Kakushima, Masahiro Watanabe, Naoyuki Shigyo, Takuya Saraya, Toshihiko Takakura, Kazuo Itou, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi, Iriya Muneta, Hitoshi Wakabayashi, Sinichi Nishizawa, Kazuo Tsutsui, Toshiro Hiramoto, Hiromichi Ohashi, Hiroshi Iwai.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Sept. 2018

Publisher

Japanese:
English:

Conference name

Japanese:
English:	44th European Solid-State Circuits Conference (ESSDERC2018)

Conference site

Japanese:
English:	Dresden