3D Atomic Imaging of As Doped in Si by Spectro-Photoelectron Holography

Publication Information

Title

Japanese:
English:	3D Atomic Imaging of As Doped in Si by Spectro-Photoelectron Holography

Author

Japanese:	筒井一生, Tomohiro Matsushita, 室隆桂之, Yoshitada Morikawa, 名取鼓太郎, 星井拓也, 角嶋邦之, 若林整, Kouichi Hayashi, Fumihiko Matsui, 木下豊彦.
English:	Kazuo Tsutsui, Tomohiro Matsushita, Takayuki Muro, Yoshitada Morikawa, Kotaro Natori, Takuya Hoshii, Kuniyuki Kakushima, Hitoshi Wakabayashi, Kouichi Hayashi, Fumihiko Matsui, Toyohiko Kinoshita.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Nov. 2019

Publisher

Japanese:
English:

Conference name

Japanese:
English:	8th International Symposium on Control of Semiconductor Interfaces (ISCSI-8)

Conference site

Japanese:
English:	Sendai