Nanometer-scale dielectric constant of Ge quantum dots using apertureless near-field scanning optical microscopy

Publication Information

Title

Japanese:
English:	Nanometer-scale dielectric constant of Ge quantum dots using apertureless near-field scanning optical microscopy

Author

Japanese:	Ogawa, Y., 南不二雄, Abate, Y., Leone, S.R..
English:	Ogawa, Y., FUJIO MINAMI, Abate, Y., Leone, S.R..

Language

English

Journal/Book name

Japanese:
English:	Applied Physics Letters

Volume, Number, Page

Vol. 96 No. 6 p. 063107

Published date

Feb. 2010

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI