Structure and energetics of carbon defects in SiC (0001)/SiO2 systems at realistic temperatures: Defects in SiC, SiO2, and at their interface

Publication Information

Title

Japanese:
English:	Structure and energetics of carbon defects in SiC (0001)/SiO2 systems at realistic temperatures: Defects in SiC, SiO2, and at their interface

Author

Japanese:	小林拓真, 松下雄一郎.
English:	Takuma Kobayashi, Yu-ichiro Matsushita.

Language

English

Journal/Book name

Japanese:
English:	Journal of Applied Physics

Volume, Number, Page

Vol. 126 No. 14 p. 145302

Published date

Oct. 10, 2019

Publisher

Japanese:
English:	AIP Publishing

Conference name

Japanese:
English:

Conference site

Japanese:
English:

File

Official URL

DOI