Path clustering for adaptive test

Publication Information

Title

Japanese:
English:	Path clustering for adaptive test

Author

Japanese:	Uezono, T., Takahashi, T., Shintani, M., Hatayama, K., 益一哉, Ochi, H., Sato, T..
English:	Uezono, T., Takahashi, T., Shintani, M., Hatayama, K., Kazuya Masu, Ochi, H., Sato, T..

Language

English

Journal/Book name

Japanese:
English:	Proceedings of the IEEE VLSI Test Symposium

Volume, Number, Page

pp. 15-20

Published date

2010

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI