Hypersphere sampling for accelerating high-dimension and low-failure probability circuit-yield analysis

Publication Information

Title

Japanese:
English:	Hypersphere sampling for accelerating high-dimension and low-failure probability circuit-yield analysis

Author

Japanese:	Hagiwara, S., Date, T., 益一哉, Sato, T..
English:	Hagiwara, S., Date, T., Kazuya Masu, Sato, T..

Language

English

Journal/Book name

Japanese:
English:	IEICE Transactions on Electronics

Volume, Number, Page

Vol. E97-C No. 4 pp. 280-288

Published date

2014

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI