Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing

Publication Information

Title

Japanese:
English:	Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing

Author

Japanese:	Shintani, M., Uezono, T., Hatayama, K., 益一哉, Sato, T..
English:	Shintani, M., Uezono, T., Hatayama, K., Kazuya Masu, Sato, T..

Language

English

Journal/Book name

Japanese:
English:	Journal of Electronic Testing: Theory and Applications (JETTA)

Volume, Number, Page

Vol. 32 No. 5 pp. 601-609

Published date

2016

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI