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Title
Japanese: 
English:Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing 
Author
Japanese: Shintani, M., Uezono, T., Hatayama, K., η›ŠδΈ€ε“‰, Sato, T..  
English: Shintani, M., Uezono, T., Hatayama, K., Kazuya Masu, Sato, T..  
Language English 
Journal/Book name
Japanese: 
English:Journal of Electronic Testing: Theory and Applications (JETTA) 
Volume, Number, Page Vol. 32    No. 5    pp. 601-609
Published date 2016 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English: 
Conference site
Japanese: 
English: 
DOI https://doi.org/10.1007/s10836-016-5614-0

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