X 線光電子顕微鏡を用いたDLC 膜の摺動痕の観察

Publication Information

Title

Japanese:	X 線光電子顕微鏡を用いたDLC 膜の摺動痕の観察
English:	Observation of sliding mark on DLC film surface using X-ray photoemission electron microscopy

Author

Japanese:	法月奏太, Sarayut Tunmee, Chanan Euaruksakun, Ukit Rittihong, 富所優志, Ratchadaporn Supruangnet, 平田祐樹, 大竹尚登, 赤坂大樹.
English:	Sota Norizuki, Sarayut Tunmee, Chanan Euaruksakun, Ukit Rittihong, Masashi Tomidokoro, Ratchadaporn Supruangnet, Yuki Hirata, Naoto Ohtake, Hiroki Akasaka.

Language

Japanese

Journal/Book name

Japanese:	2020年第67回応用物理学会春季学術講演会
English:	Abst. DVD of 67th JSAP Spring Meeting 2020

Volume, Number, Page

Published date

Mar. 12, 2020

Publisher

Japanese:
English:

Conference name

Japanese:	2020年第67回応用物理学会春季学術講演会
English:	67th JSAP Spring Meeting 2020

Conference site

Japanese:
English: