Interfacial Dipole Measurement of Dielectric/Silicon Interface by X-ray Photoelectron Spectroscopy

Publication Information

Title

Japanese:
English:	Interfacial Dipole Measurement of Dielectric/Silicon Interface by X-ray Photoelectron Spectroscopy

Author

Japanese:	角嶋邦之, 岡本巧馬, 舘喜一, 清水智, Jin Jisong, 川那子高暢, AHMET PARHAT, 杉井信之, 筒井一生, 服部健雄, 岩井洋.
English:	K. Kakushima, K. Okamoto, K. Tachi, S. Sato, J. Song, T. Kawanago, P. Ahmet, N. Sugii, K. Tsutsui, T. Hattori, H. Iwai.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Oct. 2008

Publisher

Japanese:
English:

Conference name

Japanese:
English:	214th ECS Meeting (PRiME 2008)

Conference site

Japanese:
English:	Hawaii