Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements

Publication Information

Title

Japanese:
English:	Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements

Author

Japanese:	Lu Mao, 藤波想, Wentao Liu, 中嶋健.
English:	Lu Mao, So Fujinami, Wentao Liu, Ken Nakajima.

Language

English

Journal/Book name

Japanese:
English:	Polym. Test.

Volume, Number, Page

Volume 93 106919

Published date

Oct. 17, 2020

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI