Barkhausen Noise Analysis of Thin Film Ferroelectrics

Publication Information

Title

Japanese:
English:	Barkhausen Noise Analysis of Thin Film Ferroelectrics

Author

Japanese:	矢澤慶祐, Benjamin Ducharne, 内田寛, 舟窪浩, John E. Blendell.
English:	Keisuke Yazawa, Benjamin Ducharne, Hiroshi Uchida, Hiroshi Funakubo, John E. Blendell.

Language

English

Journal/Book name

Japanese:
English:	Appl. Phys. Lett.

Volume, Number, Page

Vol. 117 pp. 012902-1-4

Published date

June 2020

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI