Solid-state beam scanner based on VCSEL integrated amplifier with scan resolution of over 200

Publication Information

Title

Japanese:
English:	Solid-state beam scanner based on VCSEL integrated amplifier with scan resolution of over 200

Author

Japanese:	Hu Shanting, 鷹箸雅司, 顧暁冬, 志村京亮, 小山二三夫.
English:	Shanting Hu, Masashi Takanohashi, Xiaodong Gu, Keisuke Shimura, Fumio Koyama.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

SM2M.2

Published date

May 2020

Publisher

Japanese:
English:

Conference name

Japanese:
English:	2020 Conference on Lasers and Electro-Optics

Conference site

Japanese:
English:	San Jose