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Publication Information
Title
Japanese:
はんだ接続部の微細疲労き裂測定技術の開発 − 熱抵抗によるダイオードのはんだクラックの検出
English:
Author
Japanese:
篠田 卓也
, 平松 聖史,
Y. Liu
, 安井 龍太,
伏信 一慶
.
English:
Takuya Shinoda
, Hiramatsu,
Yung Chi Liu
, R. Yasui,
KAZUYOSHI FUSHINOBU
.
Language
Japanese
Journal/Book name
Japanese:
第58回日本伝熱シンポジウム講演論文集
English:
Volume, Number, Page
Published date
May 2021
Publisher
Japanese:
English:
Conference name
Japanese:
第58回日本伝熱シンポジウム
English:
Conference site
Japanese:
郡山(オンライン)
English:
©2007
Tokyo Institute of Technology All rights reserved.