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Title
Japanese:はんだ接続部の微細疲労き裂測定技術の開発 − チップコンデンサのはんだクラック非破壊検出 
English: 
Author
Japanese: 安井 龍太, Y. Liu, 篠田 卓也, 伏信 一慶.  
English: R. Yasui, Yung Chi Liu, Takuya Shinoda, KAZUYOSHI FUSHINOBU.  
Language Japanese 
Journal/Book name
Japanese:第58回日本伝熱シンポジウム講演論文集 
English: 
Volume, Number, Page        
Published date May 2021 
Publisher
Japanese: 
English: 
Conference name
Japanese:第58回日本伝熱シンポジウム 
English: 
Conference site
Japanese:郡山（オンライン） 
English: 

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