FIB (Focused Ion Beam)-etched  Micro/Nanopattern on a curve surface

Publication Information

Title

Japanese:
English:	FIB (Focused Ion Beam)-etched Micro/Nanopattern on a curve surface

Author

Japanese:	松原竜也, 小林健人, Deok-Ho Kim, 金俊完.
English:	Tatsuya Matsubara, Kento Kobayashi, Deok-Ho Kim, Joon-wan KIM.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Dec. 2021

Publisher

Japanese:
English:

Conference name

Japanese:
English:	The 6th International Symposium on Biomedical Engineering

Conference site

Japanese:
English: