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Title
Japanese: 
English:Total ionizing dose effect on 2-D array data transfer ICs designed and fabricated by 0.18 μm CMOS technology 
Author
Japanese: 依田 孝, 石原昇, 大島佑太, 安藤幹, 柏木康平, 吉田僚一郎, 木村有佐, 黒木海斗, 鍋屋信介, 平川顕二, 岩瀬正幸, 小笠原宗博, 伊藤浩之.  
English: Takashi Yoda, Noboru Ishihara, Yuta Oshima, Motoki Ando, Kohei Kashiwagi, Ryoichiro Yoshida, Arisa Kimura, Kaito Kuroki, Shinsuke Nabeya, Kenji Hirakawa, Masayuki Iwase, Munehiro Ogasawara, Hiroyuki Ito.  
Language English 
Journal/Book name
Japanese: 
English:Japanese Journal of Applied Physics 
Volume, Number, Page Vol. 61        SC1081-1
Published date Mar. 31, 2022 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English: 
Conference site
Japanese: 
English: 
DOI https://doi.org/10.35848/1347-4065/ac48d0

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