Radiation damage analysis in SiC microstructure by transmission electron microscopy

Publication Information

Title

Japanese:
English:	Radiation damage analysis in SiC microstructure by transmission electron microscopy

Author

Japanese:	Mohd Idzat bin Idris, 吉田克己, 矢野豊彦.
English:	Mohd Idzat Idris, Katsumi Yoshida, Toyohiko Yano.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Vol. 54 No. 3 pp. 991-996

Published date

Mar. 2022

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI