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Publication Information
Title
Japanese:
TID影響下におけるMOSFETの動的特性劣化モデルの開発
English:
Development of dynamic deterioration model of MOSFET under TID effect
Author
Japanese:
大島佑太
,
安藤幹
,
平川顕二
,
岩瀬正幸
,
小笠原宗博
,
依田孝
,
石原昇
,
伊藤浩之
.
English:
Yuta Oshima
,
Motoki Ando
,
Kenji Hirakawa
,
Masayuki Iwase
,
Munehiro Ogasawara
,
Takashi Yoda
,
Noboru Ishihara
,
Hiroyuki Ito
.
Language
Japanese
Journal/Book name
Japanese:
English:
Volume, Number, Page
Published date
Mar. 10, 2019
Publisher
Japanese:
English:
Conference name
Japanese:
第66回 応用物理学会春季学術講演会
English:
Conference site
Japanese:
English:
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Tokyo Institute of Technology All rights reserved.