TID影響下におけるMOSFETの動的特性劣化モデルの開発

Publication Information

Title

Japanese:	TID影響下におけるMOSFETの動的特性劣化モデルの開発
English:	Development of dynamic deterioration model of MOSFET under TID effect

Author

Japanese:	大島佑太, 安藤幹, 平川顕二, 岩瀬正幸, 小笠原宗博, 依田孝, 石原昇, 伊藤浩之.
English:	Yuta Oshima, Motoki Ando, Kenji Hirakawa, Masayuki Iwase, Munehiro Ogasawara, Takashi Yoda, Noboru Ishihara, Hiroyuki Ito.

Language

Japanese

Journal/Book name

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Volume, Number, Page

Published date

Mar. 10, 2019

Publisher

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Conference name

Japanese:	第66回応用物理学会春季学術講演会
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Conference site

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