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Title
Japanese:P型とN型のFETサイズ比が異なるCMOS論理回路へのγ線照射の影響 
English:Effect of γ-Ray Irradiation on CMOS Logic Circuits with Different P-Type and N-Type FET Size Ratios 
Author
Japanese: 木村有佐, 吉田僚一郎, 安藤幹, 大島佑太, 鍋屋信介, 平川顕二, 岩瀬正幸, 小笠原宗博, 依田孝, 石原昇, 伊藤浩之.  
English: Arisa Kimura, Ryoichiro Yoshida, Motoki Ando, Yuta Oshima, Shinsuke Nabeya, Kenji Hirakawa, Masayuki Iwase, Munehiro Ogasawara, Takashi Yoda, Noboru Ishihara, Hiroyuki Ito.  
Language Japanese 
Journal/Book name
Japanese: 
English: 
Volume, Number, Page        
Published date Sept. 15, 2021 
Publisher
Japanese: 
English: 
Conference name
Japanese:2021年 電子情報通信学会ソサイエティ大会 
English: 
Conference site
Japanese: 
English: 

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