Top-K Confidence Map Aggregation for Robust Semantic Segmentation Against Unexpected Degradation

Publication Information

Title

Japanese:
English:	Top-K Confidence Map Aggregation for Robust Semantic Segmentation Against Unexpected Degradation

Author

Japanese:	森安宙, 柴田剛志, 田中正行, 奥富正敏.
English:	Yu Moriyasu, Takashi Shibata, Masayuki Tanaka, Masatoshi Okutomi.

Language

English

Journal/Book name

Japanese:
English:	Proceedings of IEEE 41st International Conference on Consumer Electronics (ICCE2023)

Volume, Number, Page

pp. 1-6

Published date

Jan. 2023

Publisher

Japanese:
English:

Conference name

Japanese:
English:	IEEE 41st International Conference on Consumer Electronics (ICCE2023)

Conference site

Japanese:
English:	Las Vegas, NV

Official URL

DOI