Hole Concentration Reduction in CuI by Zn Substitution and its Mechanism: Toward Device Applications

Publication Information

Title

Japanese:
English:	Hole Concentration Reduction in CuI by Zn Substitution and its Mechanism: Toward Device Applications

Author

Japanese:	辻昌武, 飯村壮史, 金正煥, 細野秀雄.
English:	Masatake Tsuji, Soshi Iimura, Junghwan Kim, Hideo Hosono.

Language

English

Journal/Book name

Japanese:
English:	ACS Appl. Mater. Interfaces

Volume, Number, Page

Published date

July 2022

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

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English:

DOI