Invariant Discovery of Features Across Multiple Length Scales: Applications in Microscopy and Autonomous Materials Characterization

Publication Information

Title

Japanese:
English:	Invariant Discovery of Features Across Multiple Length Scales: Applications in Microscopy and Autonomous Materials Characterization

Author

Japanese:	Aditya Raghavan, tkarsh Pratiush, Mani Valleti, Richard(Yu) Liu, Reece Emery, 舟窪浩, Yongtao Liu, Philip Rack, Sergei Kalinin.
English:	Aditya Raghavan, tkarsh Pratiush, Mani Valleti, Richard(Yu) Liu, Reece Emery, Hiroshi Funakubo, Yongtao Liu, Philip Rack, Sergei Kalinin.

Language

English

Journal/Book name

Japanese:
English:	J. Appl. Phys.

Volume, Number, Page

Vol. 137 No. 034901 p. 1-13

Published date

Dec. 24, 2025

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI