Mechanical and electrical contact testing for Pt/PEDOT/Si layered structures

Publication Information

Title

Japanese:
English:	Mechanical and electrical contact testing for Pt/PEDOT/Si layered structures

Author

Japanese:	土屋良重, 栗岡智行, Vinaisuratern Punvinai, 樋口丈司, Chang Tso-Fu Mark, 曽根正人, Nasser Aldhahri, Liam Boodhoo, Thomas Bull, Yan Yang, John W. McBride.
English:	Yoshishige Tsuchiya, Tomoyuki Kurioka, Punvinai Vinaisuratern, Joji Higuchi, Tso-Fu Mark Chang, Masato Sone, Nasser Aldhahri, Liam Boodhoo, Thomas Bull, Yan Yang, John W. McBride.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Sept. 2025

Publisher

Japanese:
English:

Conference name

Japanese:
English:	51st International Conference on Micro and Nano Engineering (MNE2025)

Conference site

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English: