Nanorheology atomic force microscopy for measuring viscoelastic relaxation of  nanostructured polymers

Publication Information

Title

Japanese:
English:	Nanorheology atomic force microscopy for measuring viscoelastic relaxation of nanostructured polymers

Author

Japanese:	NGUYEN KIM HUNG, 中嶋健.
English:	Hung Kim Nguyen, Ken Nakajima.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

July 8, 2025

Publisher

Japanese:
English:

Conference name

Japanese:
English:	PPC19

Conference site

Japanese:	北九州
English: