異種材料集積光エレクトロニクスに向けたウェハレベルテスティング

Publication Information

Title

Japanese:	異種材料集積光エレクトロニクスに向けたウェハレベルテスティング
English:	Wafer-level Testing Technology for Heterogenous Material Integrated Optoelectronics

Author

Japanese:	堀川剛.
English:	Tsuyoshi Horikawa.

Language

Japanese

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Feb. 6, 2025

Publisher

Japanese:
English:

Conference name

Japanese:	光産業技術シンポジウム
English:	The Symposium on Optoelectronics Industry and Technology

Conference site

Japanese:	東京
English:	Tokyo