Log-Likelihood Ratio for Improving Accuracy in Silicon Spin Qubit Readout

Publication Information

Title

Japanese:
English:	Log-Likelihood Ratio for Improving Accuracy in Silicon Spin Qubit Readout

Author

Japanese:	溝口来成, 和田陸久, 松岡竜太郎, 太田俊輔, I. Yanagi, T. Mine, 土屋龍太, 久本大, 水野弘之, 小寺哲夫.
English:	R. Mizokuchi, R. Wada, R. Matsuoka, S. Ota, I. Yanagi, T. Mine, R. Tsuchiya, D. Hisamoto, H. Mizuno, T. Kodera.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Oct. 8, 2025

Publisher

Japanese:
English:

Conference name

Japanese:
English:	2nd International Workshop on Quantum Information Engineering(QIE2025)

Conference site

Japanese:	沖縄
English:	Okinawa