Detail analysis of reflection behavior for O-band and C-band silicon waveguides by OFDR profiles

Publication Information

Title

Japanese:
English:	Detail analysis of reflection behavior for O-band and C-band silicon waveguides by OFDR profiles

Author

Japanese:	堀川剛, 西山伸彦.
English:	Tsuyoshi Horikawa, Nobuhiko Nishiyama.

Language

English

Journal/Book name

Japanese:
English:	Japanese Journal of Applied Physics

Volume, Number, Page

Vol. 65 No. 4 04SP06

Published date

Feb. 24, 2026

Publisher

Japanese:
English:	The Japan Society of Applied Physics

Conference name

Japanese:
English:

Conference site

Japanese:
English: