Cryogenic Characterization of Commercial Heterojunction Bipolar Transistors as Current Amplifiers Toward Semiconductor Spin Qubit Readout

Publication Information

Title

Japanese:
English:	Cryogenic Characterization of Commercial Heterojunction Bipolar Transistors as Current Amplifiers Toward Semiconductor Spin Qubit Readout

Author

Japanese:	太田俊輔, 福田毅, 利光孝文, 溝口来成, 小寺哲夫.
English:	Shunsuke Ota, Takeshi Fukuda, Takafumi Toshimitsu, Raisei Mizokuchi, Tetsuo Kodera.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Dec. 14, 2026

Publisher

Japanese:
English:

Conference name

Japanese:
English:	1st International Workshop on Industrial-grade Ge Quantum Technology (InGeQT workshop 2025)

Conference site

Japanese:
English:	Osaka