Progress of fabrication and characterization of double quanutm dots on a Leti Ge wafer

Publication Information

Title

Japanese:
English:	Progress of fabrication and characterization of double quanutm dots on a Leti Ge wafer

Author

Japanese:	WENChutian, 荒川雄登, JIANGBO, 松岡竜太郎, 溝口来成, J.M. Hartmann, P. A. Mortemousque, 小寺哲夫.
English:	Chutian Wen, Yuto Arakawa, Bo Jiang, Ryutaro Matsuoka, Raisei Mizokuchi, J.M. Hartmann, P. A. Mortemousque, Tetsuo Kodera.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Dec. 15, 2026

Publisher

Japanese:
English:

Conference name

Japanese:
English:	1st International Workshop on Industrial-grade Ge Quantum Technology (InGeQT workshop 2025)

Conference site

Japanese:
English:	Osaka